X-ray microbeam diffraction: Rapid multilength- scale characterization spanning micrometers to millimeters
نویسندگان
چکیده
منابع مشابه
Synchrotron x-ray microbeam diffraction from abalone shell
Microstructured biomaterials such as mollusk shells receive much attention at present, due to the promise that advanced materials can be designed and synthesized with biomimetic techniques that take advantage of self-assembly and aqueous, ambient processing conditions. A satisfactory understanding of this process requires characterization of the microstructure not only in the mature biomaterial...
متن کاملMicrobeam X-ray Diffraction Study on Insulin Spherulites
Insulin is a hormone with a molecular weight of 5.7 kDa, that is composed of two polypeptide chains. In the native state, its secondary structure is primarily αhelical. However, forms a spherical precipitate called spherulite (Fig. 1), which is made of β-amyloid fibrils (Fig. 2), at low pHs and high temperatures (pH 2.0 and 37 100 oC). No chemical modification is involved in the assembly of ins...
متن کاملMicrobeam high-resolution diffraction and x-ray standing wave methods applied to semiconductor structures
A new approach to conditioning x-ray microbeams for high angular resolution x-ray diffraction and scattering techniques is introduced. We combined focusing optics (one-bounce imaging capillary) and post-focusing collimating optics (miniature Si(004) channel-cut crystal) to generate an x-ray microbeam with a size of 10μm and ultimate angular resolution of 14μrad. The microbeam was used to analys...
متن کاملA Novel 2d Analysis Method to Characterize Individual Grains Using High-energy X-ray Microbeam Diffraction
The design and development of new multiphase microstructures for specific technological applications require not only a characterization of the final microstructure, but also a detailed knowledge at the level of individual grains of the phase transformations taking place during the material processing. The availability of intense high-energy X-ray beams (50 to 300 keV) at a number of synchrotro...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2000
ISSN: 0108-7673
DOI: 10.1107/s0108767300021875